Empyrean Patron

Moore’s Law and Post-Moore’s Law are driving the industry to integrate increasing number of transistors into shrinking chips. Space left for in-chip instances and connections becomes limited and precious. Along with the benefits of FinFET and GAAFET, challenges of electronic migration and IR-drop (EM/IR) are inevitable for design process and chip sign-off. 

Empyrean Patron^® focuses on analog chip power integrity solutions. IC designers can perform comprehensive and reliable EM/IR analysis to sign-off the entire chip, with less learning effort and higher efficiency.